Display device and inspecting method thereof

ABSTRACT

An exemplary embodiment of the present inventive concept provides a display device including: a display area where an image is displayed; a peripheral area disposed outside the display area; a hole area disposed within the display area; a hole crack detection line disposed adjacent to the hole area to surround the hole area and having a first end and a second end that is separated from the first end; a first detection line extending from the peripheral area and connected to the hole crack detection line to constitute a first closed circuit; a second detection line extending from the peripheral area and connected to the hole crack detection line to constitute a second closed circuit; and a circuit portion connected to the first detection line and the second detection line

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation application of U.S. patentapplication Ser. No. 16/685,076 filed on Nov. 15, 2019, which claimspriority to and benefits of Korean Patent Application No.10-2018-0140834 filed in the Korean Intellectual Property Office on Nov.15, 2018, the entire contents of which are incorporated herein byreference.

BACKGROUND (a) Field

Embodiments of the present inventive concept relates to a display deviceand an inspecting method thereof, and more particularly to a displaydevice including a display panel having a hole formed therein and aninspecting method thereof.

(b) Description of the Related Art

A display device such as a liquid crystal display (LCD) or an organiclight emitting diode display (OLED) display includes a display panelincluding a plurality of pixels capable of displaying an image and aplurality of signal lines. Each pixel may include a pixel electrode forreceiving a data signal, and the pixel electrode may be connected to atleast one transistor to receive a data signal. The display panel mayinclude a plurality of layers that are stacked therein.

When a display panel is impacted, cracks may be formed on a substrate oron the layers stacked thereon. The cracks may grow over time or spreadto other layers or other regions, which can lead to poor display panelquality. For example, a signal line such as a data line or a gate linemay be disconnected by the cracks or may increase in resistance, andmoisture may penetrate into the display panel through the cracks,thereby reducing element reliability. As a result, various problems suchas pixels of the display panel not emitting light, erroneously emittinglight, and the like may occur.

In particular, recently developed flexible displays may be curved orbent during manufacture or use, and even when minute cracks are presentin the substrate or stacked layers of the display panel, the minutecracks may develop into larger cracks due to curving or bending of thedisplay panel.

The above information disclosed in this Background section is only forenhancement of understanding of the background of the inventive conceptand therefore it may contain information that does not form the priorart that is already known in this country to a person of ordinary skillin the art.

SUMMARY

Devices such as a camera, a flash, a speaker, and an optical sensor,which are disposed in a non-display area, may be disposed in a displayarea in order to minimize the non-display area on a front surface of thedisplay device and to maximize the display area to the entire frontsurface. For example, a hole can be formed in a display panel bypunching, and a camera, a flash, a speaker, a photosensor, etc. may bemounted in the hole. Cracks may occur during a process of forming thehole in the display panel, or cracks may occur in a portion exposed bythe hole.

The present inventive concept has been made in an effort to provide adisplay device, and an inspecting method thereof, capable of testingcracks which may occur in a display panel having a hole formed therein.

An exemplary embodiment of the present inventive concept provides adisplay device including: a display area where an image is displayed; aperipheral area disposed outside the display area; a hole area disposedwithin the display area; a hole crack detection line disposed adjacentto the hole area to surround the hole area and having a first end and asecond end that is separated from the first end; a first detection lineextending from the peripheral area and connected to the hole crackdetection line to constitute a first closed circuit; a second detectionline extending from the peripheral area and connected to the hole crackdetection line to constitute a second closed circuit; and a circuitportion connected to the first detection line and the second detectionline.

The first detection line may include a first detection transfer linehaving a first end that is connected to the circuit portion and a secondend that is connected to the first end of the hole crack detection line;and a first detection receiving line having a first end that isconnected to the circuit portion and the second end that is connected toa second end of the hole crack detection line, wherein the seconddetection line may include a second detection transfer line having afirst end that is connected to the circuit portion and a second end thatis connected to the first end of the hole crack detection line, and asecond detection receiving line having a first end that is connected tothe circuit portion and a second end that is connected to the second endof the hole crack detection line.

The first closed circuit may include the first detection transfer line,the hole crack detection line, and the first detection receiving line,and the second closed circuit may include the second detection transferline, the hole crack detection line, and the second detection receivingline.

The circuit portion may determine a hole crack defect where a crackoccurs in the hole crack detection line when both the first closedcircuit and the second closed circuit are determined to be defective.

The first detection line may include a first detection transfer linehaving a first end that is connected to the circuit portion and a secondend that is connected to the first end of the hole crack detection line;and a first detection receiving line having a first end that isconnected to the circuit portion and a second end that is connected tothe second end of the hole crack detection line, wherein the seconddetection line may include a second detection transfer line having afirst end that is connected to the circuit portion and a second end thatis connected to the second end of the hole crack detection line, and asecond detection receiving line having a first end that is connected tothe circuit portion and a second end that is connected to the first endof the hole crack detection line.

The display device may further include a third detection line extendingin parallel with the first detection line in the peripheral area andhaving opposite ends that are connected to the circuit portion toconstitute a third closed circuit; and a fourth detection line extendingin parallel with the second detection line in the peripheral area andhaving opposite ends that are connected to the circuit portion toconstitute a fourth closed circuit.

The first detection line may include a first detection transfer linehaving a first end that is connected to the circuit portion and a secondend that is connected to the second end of the hole crack detectionline; and a first detection receiving line having a first end that isconnected to the circuit portion and a second end that is connected tothe second end of the hole crack detection line, wherein the seconddetection line may include a second detection transfer line having afirst end that is connected to the circuit portion and a second end thatis connected to the first end of the hole crack detection line, and asecond detection receiving line having a first end that is connected tothe circuit portion and a second end that is connected to the first endof the hole crack detection line.

The first closed circuit may include the first detection transfer lineand the first detection receiving line, and the second closed circuitmay include the second detection transfer line and the second detectionreceiving line.

The first detection transfer line, the hole crack detection line, andthe second detection receiving line may constitute a third closedcircuit.

The circuit portion may determine a hole crack defect where a crackoccurs in the hole crack detection line when the third closed circuit isdetermined to be defective.

An exemplary embodiment of the present inventive concept provides adisplay device including: a substrate including a display area where animage is displayed and a peripheral area disposed outside the displayarea; a hole area disposed within the display area; a first detectionline constituting a first closed circuit that extends along a first edgeof the display area in the peripheral area and extending to surround afirst edge of the hole area, the first detection line including at leastfirst two lines extending substantially parallel to each other and endsof the at least first two lines being connected to each other in a firstregion adjacent to the hole area; a second detection line constituting asecond closed circuit that extends along a second edge of the displayarea in the peripheral area and extending to surround a second edge ofthe hole area opposing the first edge of the hole area, the seconddetection line including at least second two lines extendingsubstantially parallel to each other and ends of the at least second twolines being connected to each other in a second region adjacent to thehole are; and a circuit portion connected to opposite ends of the firstdetection line and opposite ends of the second detection line.

The hole area may be a region where a hole is formed by removing asubstrate and an element disposed on the substrate.

The first detection line and the second detection line may be physicallyseparated and face each other with the hole area interposedtherebetween.

The circuit portion may inspect a crack defect at the first edge of thehole area by outputting a first detection signal to the first detectionline and receiving a first closed circuit signal that is fed back, andmay inspect a crack defect at the second edge of the hole area byoutputting a second detection signal to the second detection line andreceiving a second closed circuit signal that is fed back.

An exemplary embodiment of the present inventive concept provides aninspecting method of a display device, including: outputting a firstdetection signal to a first detection line connected to a hole crackdetection line and constituting a first closed circuit, the hole crackdetection line being disposed adjacent to a hole area disposed in adisplay area to surround the hole area; outputting a second detectionsignal to a second detection line connected to the hole crack detectionline and constituting a second closed circuit; and determining a holecrack defect in which a crack occurs in the hole crack detection linebased on a first closed circuit signal received through the first closedcircuit and a second closed circuit signal received through the secondclosed circuit.

The first closed circuit may include the hole crack detection line, andthe second closed circuit may include the hole crack detection line.

The hole crack defect may be determined when the first closed circuit isdetermined to be defective by the first closed circuit signal and thesecond closed circuit is determined to be defective by the second closedcircuit signal.

The first closed circuit may include a first detection transfer line anda first detection receiving line that are connected to a second end ofthe hole crack detection line, and the second closed circuit may includea second detection transfer line and a second detection receiving linethat are connected to a first end of the hole crack detection line.

The inspecting method may further include outputting the first detectionsignal to the first detection transfer line and receiving a third closedcircuit signal through a third closed circuit formed by the firstdetection transfer line, the hole crack detection line, and the seconddetection receiving line.

The hole crack defect may be determined when the first closed circuitand the second closed circuit are determined to be normal and the thirdclosed circuit is determined to be defective.

According to the exemplary embodiments, it is possible to test a crackin the hole area in the display panel having a hole formed thereon.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a top plan view showing a display device according toan exemplary embodiment of the present inventive concept.

FIG. 2 illustrates a cross-sectional view of the display device takenalong a line II-II′ of FIG. 1.

FIG. 3 illustrates a flowchart showing an inspecting method of a displaydevice according to an exemplary embodiment of the present inventiveconcept.

FIG. 4 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 5 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 6 illustrates a cross-sectional view of the display device takenalong a line VI-VI′ of FIG. 5.

FIG. 7 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 8 illustrates a flowchart showing an inspecting method of a displaydevice according to an exemplary embodiment of the present inventiveconcept.

FIG. 9 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 10 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 11 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 12 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 13 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 14 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 15 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 16 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 17 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

FIG. 18 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

DETAILED DESCRIPTION

Embodiments of the present inventive concept will be described morefully hereinafter with reference to the accompanying drawings, in whichexemplary embodiments of the inventive concept are shown. As thoseskilled in the art would realize, the described embodiments may bemodified in various different ways, all without departing from thespirit or scope of the present inventive concept.

To clearly describe the present inventive concept, parts that areirrelevant to the description are omitted, and like numerals refer tolike or similar constituent elements throughout the specification.

Further, since sizes and thicknesses of constituent members shown in theaccompanying drawings are arbitrarily given for better understanding andease of description, the present inventive concept is not limited to theillustrated sizes and thicknesses. In the drawings, the thicknesses oflayers, films, panels, regions, etc., are exaggerated for clarity. Inthe drawings, for better understanding and ease of description, thethicknesses of some layers and areas are exaggerated.

It will be understood that when an element such as a layer, film,region, or substrate is referred to as being “on” another element, itcan be directly on the other element or intervening elements may also bepresent. In contrast, when an element is referred to as being “directlyon” another element, there are no intervening elements present. Further,the word “over” or “on” means positioning on or below the objectportion, and does not necessarily mean positioning on the upper side ofthe object portion based on a gravity direction.

In addition, unless explicitly described to the contrary, the word“comprise” and variations such as “comprises” or “comprising” will beunderstood to imply the inclusion of stated elements but not theexclusion of any other elements.

Hereinafter, a display device according to an exemplary embodiment willbe described with reference to FIG. 1 and FIG. 2, and an inspectingmethod of a display device according to an exemplary embodiment will bedescribed with reference to FIG. 3.

FIG. 1 illustrates a top plan view showing a display device according toan exemplary embodiment of the present inventive concept.

Referring to FIG. 1, the display device includes a display panel 100Aand a circuit portion 750.

The display panel 100A according to the present exemplary embodimentincludes a display area DA, a peripheral area PA, and a hole area HA.The display panel 100A may include a substrate 110, and the substrate110 may include the display area DA and the peripheral area PA.

The display area DA is an area in which an image is displayed. Thedisplay area DA includes a plurality of pixels PX, and a plurality ofsignal lines arranged on a plane parallel to a first direction D1 and asecond direction D2. A structure observed when viewed in a directionperpendicular to the first direction D1 and the second direction D2 isreferred to as a planar structure, and a structure observed when it iscut in the direction perpendicular to the first direction D1 and thesecond direction D2 is called a cross-sectional structure. The firstdirection D1 may be perpendicular to the second direction D2. Accordingto an exemplary embodiment, a portion of the display area DA may bearranged on a plane that is in parallel to the first direction D1 andthe second direction D2. Another portion of the display area DA may bedisposed on a surface or a curved surface that is bent at apredetermined angle with the plane.

The signal lines include a plurality of gate lines 121 for transferringgate signals and a plurality of data lines 171 for transferring datasignals. The plurality of gate lines 121 may extend mainly in the firstdirection D1 to be parallel to each other. The data lines 171 may extendmainly in the second direction D2 to be parallel to each other. The gatelines 121 and the data lines 171 may cross each other in the displayarea DA.

Each of the pixels PX may include at least one switching element (seeTRa in FIG. 2) and a pixel electrode (see 191 in FIG. 2) connectedthereto. The switching element may be connected to at least one gateline 121 and at least one data line 171, and is a three-terminal elementsuch as a transistor integrated in the display panel 100A. The switchingelement may be turned on or off depending on a gate signal transferredby the gate line 121 to selectively transfer the data signal to thepixel electrode.

Each of the pixels PX may emit light of one of primary colors or whitelight. Examples of the primary colors may include three primary colorsof red, green and blue. Other examples of the primary colors includeyellow, cyan, and magenta.

The substrate 110 may include glass, plastic, etc., and may haveflexibility. For example, the substrate 110 may include various plasticssuch as polyethylene terephthalate (PET), polyethylene naphthalate(PEN), polycarbonate (PC), polyarylate (PAR), polyetherimide (PEI),polyethersulfone, polyimide (PI), or the like, a metal thin film, glass,or the like.

The hole area HA is disposed in the display area DA. The hole area HAmay be a region where a hole is formed by removing the substrate 110 andan element disposed on the substrate 110. The hole may be formed bypunching the substrate 110 and the element stacked on the substrate 110.That is, the hole may be formed by punching the display panel 100A. Thehole area HA may be an area for arranging devices such as a camera, aflash, a speaker, an optical sensor, and the like in the display areaDA.

The display area DA includes a hole crack detection line HCD arrangedadjacent to the hole area HA. The hole crack detection line HCD may bedisposed adjacent to the hole area HA to surround a periphery of thehole area HA. A first end and a second end of the hole crack detectionline HCD may be separated each other. For example, the hole crackdetection line HCD may surround the periphery of the hole area HA in ashape of an upper-case omega (Ω). The hole crack detection line HCD is awire for detecting a crack in the vicinity of the hole area HA.

The peripheral area PA may surround the display area DA to be disposedoutside of the display area DA. The peripheral area PA may include afirst detection line M1 and a second detection line M2. The peripheralarea PA may include a gate driver (not illustrated) connected to thegate lines 121 to output a gate signal.

The first detection line M1 includes a first detection transfer line DT1and a first detection receiving line DR1. The first detection transferline DT1 includes a first end connected to the circuit portion 750 and asecond end connected to the first end N1 of the hole crack detectionline HCD. The first detection receiving line DR1 includes a first endconnected to the circuit portion 750 and a second end connected to thesecond end N2 of the hole crack detection line HCD. The first detectiontransfer line DT1, the hole crack detection line HCD, and the firstdetection receiving line DR1 may constitute a first closed circuit.

The first detection transfer line DT1 and the first detection receivingline DR1 are disposed in the peripheral area PA at lower, left and uppersides of the display area DA, and may be connected to the hole crackdetection line HCD at the upper side thereof. The first detectiontransfer line DT1 and the first detection receiving DR1 may extendtoward the circuit portion 750 to be connected to the circuit portion750 in the peripheral area PA disposed at the lower side of the displaypanel 110A. That is, each of the first detection transfer line DT1 andthe first detection receiving line DR1 may include a portion thatextends from the circuit portion 750 to the peripheral area PA at thelower side of the display panel 110A, a portion that extends along alower edge of the display area DA, a portion that extends along a leftedge of the display area DA, and a portion that extends along an upperedge of the display area DA. The first detection transfer line DT1 andthe first detection receiving line DR1 may extend in parallel along anedge of the display area DA.

The second detection line M2 includes a second detection transfer lineDT2 and a second detection receiving line DR2. The second detectiontransfer line DT2 includes a first end connected to the circuit portion750 and a second end connected to the first end N1 of the hole crackdetection line HCD. The second detection receiving line DR2 includes afirst end connected to the circuit portion 750 and a second endconnected to the second end N2 of the hole crack detection line HCD. Thesecond detection transfer line DT2, the hole crack detection line HCDand the second detection receiving line DR2 may constitute a secondclosed circuit.

The second detection transfer line DT2 and the second detectionreceiving line DR2 are disposed in the peripheral area PA at lower,right and upper sides of the display area DA, and may be connected tothe hole crack detection line HCD at the upper side thereof. The seconddetection transfer line DT2 and the second detection receiving line DR2may extend toward the circuit portion 750 to be connected to the circuitportion 750 in the peripheral area PA disposed at the lower side of thedisplay panel 110A. That is, each of the second detection transfer lineDT2 and the second detection receiving line DR1 may include a portionthat extends from the circuit portion 750 to the peripheral area PA atthe lower side of the display panel 110A, a portion that extends along alower edge of the display area DA, a portion that extends along a rightedge of the display area DA, and a portion that extends along an upperedge of the display area DA. The second detection transfer line DT2 andthe second detection receiving line DR2 may extend in parallel along anedge of the display area DA.

The circuit portion 750 may be disposed on a printed circuit film 700that is connected to the peripheral area PA of the display panel 100A asillustrated therein. Alternatively, the circuit portion 750 may bedirectly mounted on the peripheral area PA of the display panel 100A, ormay be formed directly on the substrate 110 together with constituentelements such as transistors of the pixel PX. The print circuit film 700may further include a data driver for generating a data signal fordriving the pixel PX, and a timing controller. The circuit portion 750may be formed as an IC chip. Hereinafter, a case where the circuitportion 750 is disposed in the printed circuit film 700 will bedescribed as an example. A case where the circuit portion 750 isdisposed in the peripheral area PA will be described with reference toFIG. 12 to FIG. 18.

The circuit portion 750 may include a plurality of pad portions that areelectrically bonded to each first end of the first detection transferline DT1, the first detection receiving line DR1, the second detectiontransfer line DT2 and the second detection receiving line DR2, or thatare electrically bonded to pads connected to each first end of the firstdetection transfer line DT1, the first detection receiving line DR1, thesecond detection transfer line DT2 and the second detection receivingline DR2. Such pads may be disposed at portions where the circuitportion 750 meets the first detection transfer line DT1, the firstdetection receiving line DR1, the second detection transfer line DT2 andthe second detection receiving line DR2.

When the circuit portion 750 is disposed on the printed circuit film700, the first detection transfer line DT1, the first detectionreceiving line DR1, the second detection transfer line DT2 and thesecond detection receiving line DR2 may extend to the printed circuitfilm 700. In this case, the first detection transfer line DT1, the firstdetection receiving line DR1, the second detection transfer line DT2 andthe second detection receiving line DR2 include wires disposed in thedisplay panel 100A and wires disposed in the printed circuit film 700 tobe connected to the circuit portion 750.

The circuit portion 750 may check whether a first closed circuit isnormal by applying a first detection signal to the first detectiontransfer line DT1 and receiving a first closed circuit signal throughthe first detection receiving line DR1. The circuit portion 750 maycheck whether a second closed circuit is normal by applying a seconddetection signal to the second detection transfer line DT2 and receivinga second closed circuit signal through the second detection receivingline DR2. In addition, the circuit portion 750 may detect a crack aroundthe hole area HA depending on whether the first closed circuit is normalor not and whether the second closed circuit is normal or not. Aninspecting method of such a display device will be described later withreference to FIG. 3.

Hereinafter, a cross-sectional structure of the display device will bedescribed with reference to FIG. 2 as well as FIG. 1.

FIG. 2 illustrates a cross-sectional view of the display device takenalong a line II-II′ of FIG. 1.

Referring to FIG. 2, a barrier layer 120 may be disposed on thesubstrate 110. The barrier layer 120 may include a plurality of layersas illustrated therein. Alternatively, the barrier layer 120 may beformed as a single layer.

Active patterns 130 and 130 d are disposed on the barrier layer 120. Theactive patterns 130 and 130 d may include an active pattern 130 disposedin the display area DA and an active pattern 130 d disposed in theperipheral area PA. Each of the active patterns 130 and 130 d mayinclude a source region and a drain region, and a channel regiondisposed therebetween. The active patterns 130 and 130 d may includeamorphous silicon, polycrystalline silicon, an oxide semiconductor, orthe like.

A first insulating layer 141 may be disposed on the active patterns 130and 130 d, and a first conductive layer may be disposed on the firstinsulating layer 141. The first conductive layer includes a conductor155 that overlaps the active pattern 130 disposed in the display areaDA, a conductor 150 d that overlaps the active pattern 130 d disposed inthe peripheral area PA, and the gate lines 121 and the like describedabove.

The active pattern 130 of the display area DA and the conductor 155which overlaps with the active pattern 130 may constitute a transistorTRa which functions as a switching element included in each pixel PX.The active pattern 130 d of the peripheral area PA and the conductor 150d which overlaps with the active pattern 130 d may constitute atransistor TRd which functions as a switching element included in thegate driver.

A second insulating layer 142 may be disposed on the first conductivelayer and the first insulating layer 141, and a second conductive layermay be disposed on the second insulating layer 142. The secondconductive layer may include a first detection line Ml, a seconddetection line M2, and a hole crack detection line HCD. According to anembodiment, at least one of the first detection line M1, the seconddetection line M2, and the hole crack detection line HCD may be disposedin a conductive layer other than the second conductive layer. Forexample, the hole crack detection line HCD may be disposed in a fourthconductive layer or a fifth conductive layer to be described later.

A third insulating layer 160 may be disposed on the second conductivelayer and the second insulating layer 142.

At least one of the first insulating layer 141, the second insulatinglayer 142, and the third insulating layer 160 may include an inorganicinsulating material such as a silicon nitride (SiN_(x)), a silicon oxide(SiO_(x)), or a silicon oxynitride (SiON), and/or an organic insulatingmaterial.

The first insulating layer 141, the second insulating layer 142, and thethird insulating layer 160 may include contact holes 165 exposing thesource region and/or the drain region of the transistors TRa and TRd.

A third conductive layer may be disposed on the third insulating layer160. The third conductive layer may include a conductor 170 connected tothe source region or the drain region of the transistors TRa and TRdthrough the contact holes 165, a voltage transfer line 177 and the dataline 171 as described above. The voltage transfer line 177 may bedisposed in the peripheral area PA to transfer a common voltage.

At least one of the first conductive layer, the second conductive layer,and the third conductive layer is made of a conductive material such ascopper (Cu), aluminum (Al), molybdenum (Mo), titanium (Ti), tantalum(Ta), and an alloy of at least two metals thereof.

A passivation layer 180 is formed on the third conductive layer and thethird insulating layer 160. The passivation layer 180 may include aninorganic insulating material and/or an organic insulating material. Theorganic insulating material may include a polyacrylic resin, apolyimide-based resin, and the like. A top surface of the passivationlayer 180 may be planarized. The passivation layer 180 may have acontact hole exposing the voltage transfer line 177 disposed in theperipheral area PA.

A pixel electrode layer is disposed on the passivation layer 180. Thepixel electrode layer may include a pixel electrode 191 corresponding toeach pixel PX in the display area DA, and a voltage transfer electrode197 disposed in the peripheral area PA. The voltage transfer electrode197 is physically and electrically connected to the voltage transferline 177 through a contact hole in the passivation layer 180 to receivea common voltage. The pixel electrode layer may include a transflectiveconductive material or a reflective conductive material.

A pixel definition layer 350 is disposed on the passivation layer 180and the pixel electrode layer. The pixel definition layer 350 may havean opening 351 disposed on the pixel electrode 191, and at least one damportion 350 d disposed in the peripheral area PA. The dam portion 350 dmay extend along an edge of the substrate 110 in a plan view. A spacer360 d may be further disposed on the dam portion 350 d. The pixeldefinition layer 350 may include a photosensitive material such as apolyacrylic resin or a polyimide-based resin.

As illustrated in FIG. 2, the first detection line M1 may be disposed atan opposite side (outside) of the display area DA with respect to thedam portion 350 d. Similarly, the second detection line M2 may bedisposed at the opposite side of the display area DA with respect to thedam portion 350 d. According to an exemplary embodiment, the firstdetection line M1 and the second detection line M2 may be disposed atthe same side of the display area DA with respect to the dam portion 350d, for example, inside of the dam portion 350 d.

The voltage transfer electrode 197 includes a portion that is notcovered by the pixel definition layer 350.

An emission layer 370 is disposed on the pixel electrode 191. Theemission layer 370 may include a portion disposed within the opening 351of the pixel definition layer 350. The emission layer 370 may furtherinclude at least one dummy emission layer 370 d disposed in theperipheral area PA and disposed on the pixel definition layer 350. Theemission layer 370 may include an organic emission material or aninorganic emission material.

A common electrode 270 may be disposed on the emission layer 370. Thecommon electrode 270 may also be formed on the pixel definition layer350 and continuously formed over the pixels PX. The common electrode 270is physically and electrically connected to the voltage transferelectrode 197 in the peripheral area PA to receive a common voltage. Thecommon electrode 270 may include a transparent conductive material.

The pixel electrode 191, the emission layer 370, and the commonelectrode 270 of each pixel PX constitute a light emitting diode ED, andone of the pixel electrode 191 and the common electrode 270 serves as ananode and the other serves as a cathode.

An encapsulation portion 380 for protecting and encapsulating the lightemitting diode ED may be disposed on the common electrode 270. Theencapsulation portion 380 may include at least one of inorganic layers381 and 383 and at least one organic layer 382. At least one of theinorganic layers 381 and 383 and at least one organic layer 382 may bealternately stacked. The organic layer 382 may include an organicmaterial and may have a planarizing property. The inorganic layers 381and 383 may be made of an inorganic material such as an aluminum oxide(AlO_(x)), a silicon oxide (SiO_(x)), a silicon nitride (SiN_(x)), and asilicon oxynitride (SiON).

A planar area of the inorganic layers 381 and 383 is wider than that ofthe organic layer 382, allowing the two inorganic layers 381 and 383 tocontact each other in the peripheral area PA. The inorganic layer 381disposed at a lowest position of the inorganic layers 381 and 383 maycontact an upper surface of the third insulating layer 160 in theperipheral area PA, but the present inventive concept is not limitedthereto.

An edge of the organic layer 382 included in the encapsulation portion380 may be disposed between the dam portion 350 d and the display areaDA. The dam portion 350 d may function to prevent the organic materialfrom flowing out when the organic layer 382 of the encapsulation portion380 is formed.

A buffer layer 389 including an inorganic insulating material and/or anorganic insulating material may be disposed on the encapsulation portion380. The buffer layer 389 may be omitted.

A fourth conductive layer may be disposed on the buffer layer 389. Thefourth conductive layer may include a first touch conductor TEa. A firsttouch insulation layer 391 may be disposed on the fourth conductivelayer, and a fifth conductive layer may be disposed on the first touchinsulation layer 391. The fifth conductive layer may include a secondtouch conductor TEb. A second touch insulating layer 392 may be disposedon the fifth conductive layer. The first touch conductor TEa and thesecond touch conductor TEb constitute a capacitive touch sensor, and maydetect touch information such as touch existence or touch position whenan external object is touched.

Hereinafter, an inspecting method of the display device will bedescribed with reference to FIG. 3 as well as FIG. 1.

FIG. 3 illustrates a flowchart showing an inspecting method of a displaydevice according to an exemplary embodiment of the present inventiveconcept.

Referring to FIG. 3, the circuit portion 750 outputs the first detectionsignal to the first detection transfer line DT1 (S101). The firstdetection signal is transferred to a first end N1 of the hole crackdetection line HCD through the first detection transfer line DT1 and tothe first detection receiving line DR1 through the hole crack detectionline HCD.

The circuit portion 750 receives the first detection signal transferredthrough the first detection receiving line DR1 as a first closed circuitsignal (S102). That is, the circuit portion 750 receives the firstclosed circuit signal transferred through the first closed circuitformed by the first detection transfer line DT1, the hole crackdetection line HCD, and the first detection receiving line DR1. Thefirst closed circuit signal may be received as a voltage that is lowerthan the first detection signal by a level corresponding to theresistance of the first detection transfer line DT1, the hole crackdetection line HCD, and the first detection receiving line DR1.

The circuit portion 750 determines whether the first closed circuit isnormal or not (S103). The circuit portion 750 may determine that thefirst closed circuit is normal when a voltage of the first closedcircuit signal is included in a predetermined reference voltage range.The reference voltage range may be predetermined by reflecting a resultof measuring the voltage of the first closed circuit signal in a statewhere no crack occurs in the display panel 100A and stored in thecircuit portion 750. Alternatively, the circuit portion 750 maydetermine that the first closed circuit is normal based on the firstclosed circuit signal when the resistance of the first detectiontransfer line DT1, the hole crack detection line HCD, and the firstdetection receiving line DR1 is included in a reference resistancerange. The reference resistance range may be predetermined by reflectinga result of measuring the resistance of the first detection transferline DT1, the hole crack detection line HCD, and the first detectionreceiving line DR1 in a state where no crack occurs in the display panel100A and stored in the circuit portion 750.

When the first closed circuit is normal, the circuit portion 750 outputsa second detection signal to the second detection transfer line DT2(S104). The second detection signal is transferred to the first end N1of the hole crack detection line HCD through the second detectiontransfer line DT2 and to the second detection receiving line DR2 throughthe hole crack detection line HCD.

The circuit portion 750 receives the second detection signal transferredthrough the second detection receiving line DR2 as a second closedcircuit signal (S105). That is, the circuit portion 750 receives thesecond closed circuit signal transferred through the second closedcircuit formed by the second detection transfer line DT2, the hole crackdetection line HCD, and the second detection receiving line DR2. Thesecond closed circuit signal may be received as a voltage that is lowerthan the second detection signal by a level corresponding to theresistance of the second detection transfer line DT2, the hole crackdetection line HCD, and the second detection receiving line DR2.

The circuit portion 750 determines whether the second closed circuit isnormal or not (S106). The circuit portion 750 may determine that thesecond closed circuit is normal when a voltage of the second closedcircuit signal is included in a predetermined reference voltage range.Alternatively, the circuit portion 750 may determine that the secondclosed circuit is normal based on the second closed circuit signal whenthe resistance of the second detection transfer line DT2, the hole crackdetection line HCD, and the second detection receiving line DR2 isincluded in a reference resistance range.

When the second closed circuit is normal, the circuit portion 750determines that the display panel 100A is good (S107). That is, thecircuit portion 750 may determine that no crack has occurred in thevicinity of the edge and the hole of the display panel 100A.

The circuit portion 750 determines a defect of the second detection lineM2 exist when the voltage of the second closed circuit signal is notincluded in the predetermined reference voltage range or the resistanceof the second detection transfer line DT2, the hole crack detection lineHCD, and the second detection receiving line DR2 is not included in thereference resistance range. That is, the circuit portion 750 maydetermine that a crack has occurred at a right edge or an upper edge ofthe display panel 100A. The circuit portion 750 may generate and outputa signal corresponding to a crack defect of the second detection lineM2.

Meantime, even when the first closed circuit is not normal (isdefective), the circuit portion 750 outputs a second detection signal tothe second detection transfer line DT2 (S104′). The circuit portion 750receives the second detection signal transferred through the seconddetection receiving line DR2 as a second closed circuit signal (S105′),and determines whether the second closed circuit is normal (S106′).

When the second closed circuit is normal, the circuit portion 750determines a defect of the first detection line M1 (S109). That is, thecircuit portion 750 may determine that a crack has occurred at a leftedge or an upper edge of the display panel 100A. The circuit portion 750may generate and output a signal corresponding to a crack defect of thefirst detection line M1.

When the second closed circuit is not normal (is defective), the circuitportion 750 determines that a hole crack defect exists (S110). That is,when both of the first closed circuit and the second closed circuit aredefective, the circuit portion 750 may determine that a hole crackdefect exists in the hole crack detection line HCD. A crack may occur inboth the first detection line M1 and the second detection line M2, butit is extremely rare for a crack to occur in both the first detectionline M1 and the second detection line M2 in the manufacturing process ofthe display panel 100A. Accordingly, the circuit portion 750 maydetermine a hole crack defect exist when it is determined (measured)that both the first closed circuit and the second closed circuit aredefective. The circuit portion 750 may generate and output a signalcorresponding to the hole crack defect.

Hereinafter, a display device according to an exemplary embodiment ofthe present inventive concept will be described with reference to FIG.4. Differences from the aforementioned exemplary embodiment of FIG. 1 toFIG. 3 will be mainly described.

FIG. 4 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 4, according to the present exemplary embodiment, adisplay panel 100B included in the display device may include a firstdetection line M1 and a second detection line M2, and the firstdetection transfer line DT1 included in the first detection line M1 andthe second detection transfer line DT2 included in the second detectionline M2 may be connected to different ends of the hole crack detectionline HCD. The first detection receiving line DR1 included in the firstdetection line M1 and the second detection receiving line DR2 includedin the second detection line M2 may be connected to different ends ofthe hole crack detection line HCD.

For example, as illustrated in FIG. 4, when the first detection transferline DT1 is connected to the first end N1 of the hole crack detectionline HCD and the first detection receiving line DR1 is connected to asecond end N2 of the hole crack detection line HCD, the second detectiontransfer line DT2 may be connected to the second end N2 of the holecrack detection line HCD, and the second detection receiving line DR2may be connected to the first end N1 of the hole crack detection lineHCD

Except for these differences, the features of the exemplary embodimentsdescribed above with reference to FIG. 1 to FIG. 3 may be applied to allof the exemplary embodiments described with reference to FIG. 4, soredundant description is omitted among the exemplary embodiments.

Hereinafter, a display device according to an exemplary embodiment ofthe present inventive concept will be described with reference to FIG. 5and FIG. 6. Differences from the aforementioned exemplary embodiment ofFIG. 1 to FIG. 3 will be mainly described.

FIG. 5 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept. FIG. 6illustrates a cross-sectional view of the display device taken along aline VI-VI′ of FIG. 5.

Referring to FIG. 5 and FIG. 6, in the display panel 100C according tothe present exemplary embodiment, the peripheral area PA may furtherinclude a third detection line M3 and a fourth detection line M4 whichare not connected to the hole crack detection line HCD.

Opposite ends of the third detection line M3 may be connected to thecircuit portion 750 to constitute a third closed circuit. The thirddetection line M3 may be disposed in the peripheral area PA at lower,left, and upper sides of the display area DA. That is, the thirddetection line M3 may have two substantially parallel lines each ends ofwhich is connected to each other at the upper side of the display areaDA in the peripheral area PA and be disposed in the peripheral area PAto have a closed circuit shape that extends from the circuit portion 750toward the display area DA. For example, the third detection line M3 mayinclude a first portion extending along the lower edge of the displayarea DA in a direction that is opposite to the first direction D1, asecond portion extending along a left edge of the display area DA in thesecond direction D2, and a third portion extending along the upper edgeof the display area DA in the first direction D1.

Opposite ends of the fourth detection line M4 may be connected to thecircuit portion 750 to constitute a fourth closed circuit. The fourthdetection line M4 may be disposed in the peripheral area PA at lower,right, and upper sides of the display area DA. That is, the fourthdetection line M4 may have two substantially parallel lines each ends ofwhich is connected to each other at the upper side of the display areaDA in the peripheral area PA and be disposed in the peripheral area PAto have a closed circuit shape that extends from the circuit portion 750toward the display area DA. For example, the fourth detection line M4may include a first portion extending along the lower edge of thedisplay area DA in the first direction D1, a second portion extendingalong a right edge of the display area DA in the second direction D2,and a third portion extending along the upper edge of the display areaDA in a direction that is opposite to the first direction D1.

The third detection line M3 may be disposed outside of the firstdetection line M1. That is, the first detection line M1 may be disposedbetween the third detection line M3 and the display area DA, and thethird detection line M3 may be disposed closer to an edge of thesubstrate 110 than the first detection line M1.

The fourth detection line M4 may be disposed outside the seconddetection line M2. That is, the second detection line M2 may be disposedbetween the fourth detection line M4 and the display area DA, and thefourth detection line M4 may be disposed closer to an edge of thesubstrate 110 than the second detection line M2.

The first detection line M1 and the second detection line M2 may bedisposed in different conductive layers from the third detection line M3and the fourth detection line M4.

As illustrated in FIG. 6, the third detection line M3 may be disposed inthe second conductive layer. Similarly, the fourth detection line M4 mayalso be disposed in the second conductive layer. In this case, the firstdetection line M1 may be disposed in a fourth conductive layer, and thesecond detection line M2 may also be disposed in the fourth conductivelayer. The first detection line M1 and the second detection line M2 maybe disposed inward (between the display area DA and the dam portion 350d) with respect to the dam portion 350 d.

Alternatively, the first detection line M1 and the second detection lineM2 may be disposed in the same second conductive layer as the thirddetection line M3 and the fourth detection line M4. In this case, thefirst detection line M1 and the second detection line M2 may be disposedin parallel with the third detection line M3 and the fourth detectionline M4 at the inside or outside of the dam portion 350 d.

The circuit portion 750 may output a third detection signal to the thirddetection line M3 and receive a third detection signal (or a thirdclosed circuit signal) that is fed back to inspect crack defects at thelower edge, the left edge and the upper edge of the display panel 100C.The circuit portion 750 may output a fourth detection signal to thefourth detection line M4 and receive a fourth detection signal (or afourth closed circuit signal) that is fed back to inspect crack defectsat the lower edge, the right edge and the upper edge of the displaypanel 100C.

Except for these differences, the features of the exemplary embodimentsdescribed above with reference to FIG. 1 to FIG. 3 may be applied to theexemplary embodiment described with reference to FIG. 5 and FIG. 6, soredundant description is omitted among the exemplary embodiments.

Hereinafter, a display device according to an exemplary embodiment ofthe present inventive concept will be described with reference to FIG.7, and an inspecting method of the display device of FIG. 7 will bedescribed with reference to FIG. 8. Differences from the aforementionedexemplary embodiment of FIG. 1 to FIG. 3 will be mainly described.

FIG. 7 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept. FIG. 8illustrates a flowchart showing an inspecting method of a display deviceaccording to an exemplary embodiment of the present inventive concept.

Referring to FIG. 7, according to the present exemplary embodiment, thedisplay panel 100D may include a first detection line M1 and a seconddetection line M2, which are connected with different ends of the holecrack detection line HCD, a first detection transfer line DT1 and afirst detection receiving line DR1 included in the first detection lineM1 may be connected with the same ends of the hole crack detection lineHCD, and the second detection transfer line DT2 and the second detectionreceiving line DR2 included in the second detection line M2 may beconnected with the same ends of the hole crack detection line HCD.

For example, as illustrated in FIG. 7, the first detection transfer lineDT1 and the first detection receiving line DR1 may be connected with asecond end N2 of the hole crack detection line HCD, and the seconddetection transfer line DT2 and the second detection receiving line DR2may be connected with a first end N1 of the hole crack detection lineHCD. The first detection transfer line DT1 and the first detectionreceiving line DR1 may be connected to each other at the second end N2of the hole crack detection line HCD to constitute a first closedcircuit. The second detection transfer line DT2 and the second detectionreceiving line DR2 may be connected to each other at the first end N1 ofthe hole crack detection line HCD to constitute a second closed circuit.In addition, the first detection transfer line DT1, the hole crackdetection line HCD, and the second detection receiving line DR2 mayconstitute a third closed circuit. The second detection transfer lineDT2, the hole crack detection line HCD, and the first detectionreceiving line DR1 may constitute a fourth closed circuit.

In this case, the display device may be inspected as illustrated in FIG.8. Referring to FIG. 8, the circuit portion 750 outputs the firstdetection signal to the first detection transfer line DT1 (S201). Thefirst detection signal is transferred to the second end N2 of the holecrack detection line HCD through the first detection transfer line DT1and transferred to the first detection receiving line DR1 at the secondend N2.

The circuit portion 750 receives the first detection signal transferredthrough the first detection receiving line DR1 as a first closed circuitsignal (S202). That is, the circuit portion 750 receives the firstclosed circuit signal transferred through the first detection transferline DT1, the second end N2 of the hole crack detection line HCD, andthe first detection receiving line DR1.

The circuit portion 750 determines whether the first closed circuit isnormal or not (S203).

When a voltage of the first closed circuit signal is not included in apredetermined reference voltage range or a resistance of the firstclosed circuit is not included in a reference resistance range, thecircuit portion 750 determines that a defect of the first detection lineM1 exists (S204). That is, the circuit portion 750 may determine that acrack has occurred at a lower edge, a left edge or an upper edge of thedisplay panel 100D.

When the first closed circuit is normal, the circuit portion 750 outputsa second detection signal to the second detection transfer line DT2(S205). The second detection signal is transferred to the first end N1of the hole crack detection line HCD through the second detectiontransfer line DT2 and transferred to the second detection receiving lineDR2 at the first end N1.

The circuit portion 750 receives the second detection signal transferredthrough the second detection receiving line DR2 as a second closedcircuit signal (S206). That is, the circuit portion 750 receives thesecond closed circuit signal transferred through the second closedcircuit formed by the second detection transfer line DT2, the first endN1 of the hole crack detection line HCD, and the second detectionreceiving line DR2.

The circuit portion 750 determines whether the second closed circuit isnormal or not (S207).

When a voltage of the second closed circuit signal is not included in apredetermined reference voltage range or a resistance of the secondclosed circuit is not included in a reference resistance range, thecircuit portion 750 determines that a defect of the second detectionline M2 exists (S208). That is, the circuit portion 750 may determinethat a crack has occurred at a lower edge, a right edge or an upper edgeof the display panel 100D. Meantime, even when the first closed circuitis not normal, the outputting of the second detection signal (S205), thereceiving of the second closed circuit signal (S206), the determiningwhether the second closed circuit is normal (S207), and the determiningwhether the defect of the second detection line M2 exists (S208) may befurther performed as necessary.

When the second closed circuit is normal, the circuit portion 750outputs the first detection signal to the first detection transfer lineDT1 or the second detection signal to the second detection transfer lineDT2 (S209). Hereinafter, an example in which the circuit portion 750outputs the first detection signal to the first detection transfer lineDT1 will be described. The first detection signal is transferred to thesecond end N2 of the hole crack detection line HCD through the firstdetection transfer line DT1 and to the second detection receiving lineDR2 through the hole crack detection line HCD.

The circuit portion 750 receives the first detection signal transferredthrough the second detection receiving line DR2 as a third closedcircuit signal (S210). That is, the circuit portion 750 receives thethird closed circuit signal transferred through the third closed circuitformed by the first detection transfer line DT1, the hole crackdetection line HCD, and the second detection receiving line DR2. Whenthe circuit portion 750 outputs the second detection signal to thesecond detection transfer line DT2, the circuit portion 750 may receivea fourth closed circuit signal transferred through the fourth closedcircuit formed by the second detection transfer line DT2, the hole crackdetection line HCD, and the first detection receiving line DR1.

The circuit portion 750 determines whether the third closed circuit isnormal or not (S211). The circuit portion 750 may determine that thethird closed circuit is normal when the voltage of the third closedcircuit signal is included in a predetermined reference voltage range ora resistance of the third closed circuit is included in a referenceresistance range.

When the third closed circuit is normal, the circuit portion 750determines that the display panel 100D is good (S212). That is, thecircuit portion 750 may determine that no crack has occurred in thedisplay panel 100D.

When the third closed circuit is not normal, the circuit portion 750determines that a hole crack defect exists (S213). That is, when it isdetermined (measured) that the third closed circuit is defective, thecircuit portion 750 may determine a hole crack defect in which a crackhas occurred in the hole crack detection line HCD. Alternatively, whenthe circuit unit 750 receives the fourth closed circuit signal, it ispossible to determine whether the display panel 100D is good ordetermine the hole crack defect depending on whether the fourth closedcircuit signal is normal or not.

Except for these differences, the features of the exemplary embodimentsdescribed above with reference to FIG. 1 to FIG. 3 may be applied to theexemplary embodiment described with reference to FIG. 7 and FIG. 8, soredundant description is omitted among the exemplary embodiments.

Hereinafter, a display device according to an exemplary embodiment ofthe present inventive concept will be described with reference to FIG.9. Differences from the aforementioned exemplary embodiment of FIG. 1and FIG. 2 will be mainly described.

FIG. 9 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 9, in the display panel 100E according to the presentexemplary embodiment, the hole crack detection line HCD may be omitted,and a first detection line M1′ and a second detection line M2′ eachhaving opposite ends connected to the circuit portion 750 may bedisposed to surround the hole area HA.

The opposite ends of the first detection line M1′ may be connected tothe circuit portion 750 to form the first closed circuit, and theopposite ends of the second detection line M2′ may be connected to thecircuit portion 750 to form the second closed circuit. The firstdetection line M1′ may be disposed in a closed-circuit shape thatextends from the circuit portion 750 toward the display area DA and thenextends along a lower edge, a left edge, and an upper edge of thedisplay area DA, and then extends from an upper edge thereof adjacent tothe hole area HA toward the display area DA, and extends to surround aleft edge of the hole area HA to return in a reverse direction. Thesecond detection line M2′ may be disposed in a closed-circuit shape thatextends from the circuit portion 750 toward the display area DA and thenextends along the lower edge, a right edge, the upper edge of thedisplay area DA, and then extends from an upper edge thereof adjacent tothe hole area HA toward the display area DA, and extends to surround aright edge of the hole area HA to return in a reverse direction.

The first detection line M1′ and the second detection line M2′ may bephysically separated from each other, and may face each other with thehole area HA therebetween.

The circuit portion 750 may output the first detection signal to thefirst detection line M1′, and may receive the first detection signal fedback as the first closed circuit signal to inspect crack defects arounda lower edge, a left edge and an upper edge of the display panel 100Eand a left side of the hole area HA. The circuit portion 750 may outputthe second detection signal to the second detection line M2′, and mayreceive the second detection signal fed back as the second closedcircuit signal to inspect crack defects around a lower edge, a rightedge and the upper edge of the display panel 100E and a right side ofthe hole area HA.

Except for these differences, the features of the exemplary embodimentsdescribed above with reference to FIG. 1 and FIG. 2 may be applied tothe exemplary embodiment described with reference FIG. 9, so redundantdescription is omitted among the exemplary embodiments.

Hereinafter, a display device according to an exemplary embodiment ofthe present inventive concept will be described with reference to FIG.10. Differences from the aforementioned exemplary embodiment of FIG. 5and FIG. 6 will mainly be described.

FIG. 10 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 10, in the display panel 100F according to the presentexemplary embodiment, the second detection line M2 is omitted in thedisplay panel 100C of FIG. 5.

In this case, the circuit portion 750 may inspect crack defects at anedge of the display panel 100F by using the third detection line M3 andthe fourth detection line M4, and may perform a hole crack defectinspection by using the first detection line M1 and the hole crackdetection line HCD. That is, the circuit portion 750 may output thefirst detection signal to the first detection transfer line DT1, and mayinspect a hole crack defect by receiving the first closed circuit signaltransferred through the hole crack detection line HCD and the firstdetection receiving line DR1.

Except for these differences, the features of the exemplary embodimentdescribed above with reference to FIG. 5 and FIG. 6 may be applied tothe exemplary embodiment described with reference to FIG. 10, soredundant description is omitted among the exemplary embodiments.

Hereinafter, a display device according to an exemplary embodiment ofthe present inventive concept will be described with reference to FIG.11. Differences from the aforementioned exemplary embodiment of FIG. 5and FIG. 6 will be mainly described.

FIG. 11 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 11, in the display panel 100G according to the presentexemplary embodiment, the first detection transfer line DT1 and thesecond detection receiving line DR2 in the display panel 100C of FIG. 5are omitted. The second detection transfer line DT2 and the firstdetection receiving line DR1 constitute a first closed circuit.

In this case, the circuit portion 750 may inspect crack defects at anedge of the display panel 100G by using the third detection line M3 andthe fourth detection line M4, and may perform a hole crack defectinspection by using the second detection transfer line DT2 and the firstdetection receiving line DR1. That is, the circuit portion 750 mayoutput the first detection signal to the second detection transfer lineDT2, and may inspect a hole crack defect by receiving the first closedcircuit signal transferred through the hole crack detection line HCD andthe first detection receiving line DR1.

Except for these differences, the features of the exemplary embodimentdescribed above with reference to FIG. 5 and FIG. 6 may be applied tothe exemplary embodiment described with reference to FIG. 11, soredundant description is omitted among the exemplary embodiments.

Hereinafter, a case in which the circuit portion 750 is disposed in theperipheral area PA of the display panel will be described with referenceto FIG. 12 to FIG. 18. Differences from the display device according tothe aforementioned exemplary embodiments will be mainly described.

FIG. 12 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 12, the circuit portion 750 may be disposed in theperipheral area PA on the substrate 110 instead of being disposed on theprinted circuit film 700 described with reference to FIG. 1. The circuitportion 750 may be directly mounted on the peripheral area PA, or may beformed directly on the substrate 110 together with constituent elementssuch as transistors of the pixel PX.

In this case, the substrate 110 may include a bending area BA disposedbetween the display area DA and the circuit portion 750. The bendingarea BA may be an area where the display panel 100A′ can be bentrearward or frontward. The peripheral area PA where the circuit portion750 is disposed may be folded to a rear surface of the display panel100A′.

The first detection transfer line DT1, the first detection receivingline DR1, the second detection transfer line DT2, and the seconddetection receiving line DR2 may extend from the circuit portion 750along an edge of the display area DA through bending area BA on thesubstrate 110.

Further, some of edges of the substrate 110 may be rounded, and bentportions of the first detection transfer line DT1, the first detectionreceiving line DR1, the second detection transfer line DT2, and thesecond detection receiving line DR2 may be rounded.

Except for these features, the features of the exemplary embodimentsdescribed above with reference to FIG. 1 to FIG. 3 may be applied to theexemplary embodiment described with reference to FIG. 12, so redundantdescription is omitted among the exemplary embodiments.

FIG. 13 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

The display panel 100B′ of FIG. 13 may include all of the features ofthe exemplary embodiment described above with reference to FIG. 4, FIG.12, and FIG. 1 to FIG. 3, and thus duplicate descriptions of theexemplary embodiment will be omitted.

FIG. 14 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 14, the third detection line M3 and the fourthdetection line M4 may extend from the circuit portion 750 along the edgeof the display area DA through the bending area BA on the substrate 110.The bent portions of the third detection line M3 and the fourthdetection line M4 may be rounded depending on an edge shape of thesubstrate 110.

The display panel 100C′ of FIG. 14 may include all of the features ofthe exemplary embodiments described above with reference to FIG. 5 andFIG. 6, FIG. 12, and FIG. 1 to FIG. 3, and thus duplicate descriptionsof the exemplary embodiment will be omitted.

FIG. 15 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

The display panel 100D′ of FIG. 15 may include all of the features ofthe exemplary embodiments described above with reference to FIG. 7 andFIG. 8, FIG. 12, and FIG. 1 to FIG. 3, and thus duplicate descriptionsof the exemplary embodiment will be omitted.

FIG. 16 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 16, the first detection line M1′ and the seconddetection line M2′ may extend from the circuit portion 750 along theedge of the display area DA through the bending area BA on the substrate110. The bent portions of the first detection line M1′ and the seconddetection line M2′ may be rounded depending on an edge shape of thesubstrate 110.

The display panel 100E′ of FIG. 16 may include all of the features ofthe exemplary embodiments described above with reference to FIG. 9, FIG.12, and FIG. 1 and FIG. 2, and thus duplicate descriptions of theexemplary embodiment will be omitted.

FIG. 17 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 17, the first detection line M1, the third detectionline M3, and the fourth detection line M4 may extend from the circuitportion 750 along the edge of the display area DA through the bendingarea BA on the substrate 110. The bent portions of the first detectionline M1, the third detection line M3, and the fourth detection line M4may be rounded depending on an edge shape of the substrate 110.

The display panel 100F′ of FIG. 17 may include all of the features ofthe exemplary embodiments described above with reference to FIG. 10,FIG. 12, and FIG. 5 and FIG. 6, and thus duplicate descriptions of theexemplary embodiment will be omitted.

FIG. 18 illustrates a top plan view of a display device according to anexemplary embodiment of the present inventive concept.

Referring to FIG. 18, the second detection transfer line DT2, the firstdetection receiving line DR1, the third detection line M3, and thefourth detection line M4 may extend from the circuit portion 750 alongthe edge of the display area DA through the bending area BA on thesubstrate 110. The bent portions of the second detection transfer lineDT2, the first detection receiving line DR1, the third detection lineM3, and the fourth detection line M4 may be rounded depending on an edgeshape of the substrate 110.

The display panel 100G′ of FIG. 18 may include all of the features ofthe exemplary embodiments described above with reference to FIG. 11,FIG. 12, and FIG. 5 and FIG. 6, and thus duplicate descriptions of theexemplary embodiment will be omitted.

While exemplary embodiments of the present inventive concept have beenparticularly shown and described with reference to the accompanyingdrawings, the specific terms used herein are only for the purpose ofdescribing the inventive concept and are not intended to define themeanings thereof or be limiting of the scope of the inventive conceptset forth in the claims. Therefore, those skilled in the art willunderstand that various modifications and other equivalent embodimentsof the present inventive concept are possible. Consequently, the truetechnical protective scope of the present inventive concept must bedetermined based on the technical spirit of the appended claims.

What is claimed is:
 1. A display device comprising: a display area where an image is displayed; a peripheral area surrounding the display area; a non-display area at least partially surrounded by the display area; a crack detection line disposed adjacent to the non-display area to surround at least a portion of the non-display area and having a first end and a second end that is separated from the first end; a first detection line extending from the peripheral area and connected to the crack detection line; a second detection line extending from the peripheral area and connected to the crack detection line; and a circuit portion connected to the first detection line and the second detection line and detecting crack defects at the peripheral area and the non-display area based on signals from the first detection line and the second detection line.
 2. The display device of claim 1, wherein the first detection line includes: a first detection transfer line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line; and a first detection receiving line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line, and wherein the second detection line includes: a second detection transfer line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line, and a second detection receiving line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line.
 3. The display device of claim 2, wherein the first detection transfer line, the crack detection line, and the first detection receiving line constitute a first closed circuit and the second detection transfer line, the crack detection line, and the second detection receiving line constitute a second closed circuit.
 4. The display device of claim 3, wherein the circuit portion determines that a crack defect exists when both the first closed circuit and the second closed circuit are determined to be defective based on the signals from the first detection receiving line and the second detection receiving line.
 5. The display device of claim 1, wherein the first detection line includes: a first detection transfer line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line; and a first detection receiving line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line, and wherein the second detection line includes: a second detection transfer line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line, and a second detection receiving line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line.
 6. The display device of claim 1, further comprising: a third detection line extending in parallel with the first detection line in the peripheral area and having opposite ends that are connected to the circuit portion; and a fourth detection line extending in parallel with the second detection line in the peripheral area and having opposite ends that are connected to the circuit portion.
 7. The display device of claim 1, wherein the first detection line includes: a first detection transfer line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line; and a first detection receiving line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line, and wherein the second detection line includes: a second detection transfer line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line; and a second detection receiving line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line.
 8. The display device of claim 7, wherein the first detection transfer line and the first detection receiving line constitute a first closed circuit and the second detection transfer line and the second detection receiving line constitute a second closed circuit.
 9. The display device of claim 8, wherein the first detection transfer line, the crack detection line, and the second detection receiving line constitute a third closed circuit.
 10. The display device of claim 9, wherein the circuit portion determines that a crack defect exists at the non-display area when the third closed circuit is determined to be defective based on a signal from the second detection receiving line.
 11. A display device comprising: a substrate including a display area where an image is displayed and a peripheral area surrounding the display area; a non-display area at least partially surrounded by the display area; a first detection line extending along a first edge of the display area in the peripheral area and extending to surround a first edge of the non-display area, the first detection line including at least first two lines extending substantially parallel to each other and ends of the at least first two lines being connected to each other in a first region adjacent to the non-display area; a second detection line extending along a second edge of the display area in the peripheral area and extending to surround a second edge of the non-display area opposing the first edge of the non-display area, the second detection line including at least second two lines extending substantially parallel to each other and ends of the at least second two lines being connected to each other in a second region adjacent to the non-display area; and a circuit portion connected to opposite ends of the first detection line and opposite ends of the second detection line and configured to determine that crack defects exist at the peripheral area and the non-display area based on signals from the first second detection line and the second detection line.
 12. The display device of claim 11, wherein the non-display area is a region where a hole is formed by removing a substrate.
 13. The display device of claim 11, wherein the first detection line and the second detection line are physically separated and face each other with the non-display area interposed therebetween.
 14. The display device of claim 11, wherein the circuit portion inspects a crack defect at the first edge of the non-display area by outputting a first detection signal to the first detection line and receiving a first signal that is fed back, and inspects a crack defect at the second edge of the non-display area by outputting a second detection signal to the second detection line and receiving a second signal that is fed back.
 15. An inspecting method of a display device, the method comprising: outputting a first detection signal to a first detection line connected to a crack detection line, the crack detection line being disposed adjacent to a non-display area surrounded by a display area; receiving a first signal corresponding to the first detection signal; outputting a second detection signal to a second detection line connected to the crack detection line; receiving a second signal corresponding to the second detection signal; and detecting crack defects at the peripheral area and the non-display area based on the first signal and the second signal.
 16. The inspecting method of claim 15, wherein the detecting crack defects includes: determining that crack defects exist at the non-display area when both of the first signal and the second signal are abnormal.
 17. The inspecting method of claim 15, wherein the first detection line includes: a first detection transfer line having a first end connected to the circuit portion and a second end connected to a first end of the crack detection line; and a first detection receiving line having a first end connected to the circuit portion and a second end connected to a second end of the crack detection line, wherein the second detection line includes: a second detection transfer line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line; and a second detection receiving line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line, and wherein the first detection transfer line, the crack detection line, and the first detection receiving line constitute a first closed circuit, and the second detection transfer line, the crack detection line, and the second detection receiving line constitute a second closed circuit.
 18. The inspecting method of claim 17, wherein the receiving a first signal includes receiving the first signal from the first detection transfer line, and the receiving a second signal includes receiving the second signal from the second detection transfer line.
 19. The inspecting method of claim 15, wherein the first detection line includes: a first detection transfer line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line; and a first detection receiving line having a first end connected to the circuit portion and a second end connected to the second end of the crack detection line, wherein the second detection line includes: a second detection transfer line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line; and a second detection receiving line having a first end connected to the circuit portion and a second end connected to the first end of the crack detection line, and wherein the first detection transfer line, the crack detection line, and the second detection receiving line constitute a third closed circuit.
 20. The inspecting method of claim 19, further comprising: outputting a third detection signal to the first detection transfer line; receiving a third signal from the second detection receiving line; and detecting a crack defect at the non-display area based on the third signal. 